Different machines to meet all needs
Used to prepare specimens for scanning electron microscope (SEM) imaging and analytical studies such as EDX and EBSP, the versatile IM4000 is capable of both pin-point cross-section and flat surface ion milling. The two IM4000 applications, cross section and flat surface milling, are realised via 2 different removable sample stage units, allowing for convenient specimen setting and cutting ...
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The latest generation of broad ion beam milling systems with improved milling speed. The IM4000Plus Ion Milling System utilizes a broad, low-energy Ar+ ion beam milling method to produce wider, undistorted cross-section milling or flat milling, without applying mechanical stress to the sample.
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Ion Milling System IM4000 CAM Programming Tip: Thread Milling Coromant.Wee to the Thread Milling CAM tip from our CAM Programming Tip Series. Thread Milling is a great alternative for threading holes and bosses..
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The IM4000 Ar Ion Milling System offers two milling configurations available in a single instrument: cross section cutting and wide-area sample surface fine polishing. The new Ar ion gun design, with increased milling rate (300µm/h for Si), affords reduced cross section processing times by as much as 65%.
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Ion Milling System IM4000 CAM Programming Tip: Thread Milling Coromant.Wee to the Thread Milling CAM tip from our CAM Programming Tip Series. Thread Milling is a great alternative for threading holes and bosses..
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IM4000Plus Hybrid broad ion beam system for flatmilling ™, and Cross-section Milling in one unit. Traditional mechanical sample preparation via grinding and polishing can result in deformation, flaws, and artifacts that obscure the true structure of the material.
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The IM4000 can be used for cross-sectioning samples (usually for SEM viewing) or for polishing surfaces. This ion mill uses a knife edge to mask the ion beam, creating...
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IM4000 Ion Milling System | High Technologies America, Inc. The IM4000 Ar ion milling system makes two milling configurations available . 's new IM4000 now allows to run both applications within the same machine. . Conventional mechanical polishing or cutting techniques on soft and . »More detailed
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The IM4000 Plus Series Ion-Milling Systems are the second-generation IM4000 series hybrid instruments supporting Cross-Section Milling and Flatmilling®. A wide variety of system configurations are offered: Standard, Cooling, Air Protection, Cooling & Air Protection.
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Sage Analytical Lab develops a unique and specific Reactive Ion Etcher recipe for each device that is received. Sage Analytical Laboratories' Reactive Ion Etcher, the SAMCO RIE-1C is designed to achieve uniformity on every sample type and in every case. It is equipped with an all solid state, crystal controlled 13.56 MHz power supply, 300 W ...
GET PRICE >>North America and Latin America are the dominating market in global Ion Milling system market followed by Europe. Global Ion Milling Systems Market will grow over the forecast period owing to factors that developed forensic departments, vast geological structure and increasing investments in medical sciences by government.
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ArBlade 5000 Ion-Milling System has released the "ArBlade 5000", our top of the line ion-milling system for producing exceptional quality cross section or flat-milling samples for electron microscopy. The "ArBlade 5000" is the newest addition to 's ion-
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Oct 02, 2018 · Broad Beam Ion Mill Demo on Oct 24, 2018 and Geosciences to host a demo of IM40000Plus high-speed millThe IM4000 Ion Milling System was released in late 2010 as a device offering two key features: (a) as a hybrid ion-milling machine supporting both cross-section and flat milling—two widely used types of ion milling—the machine meets a wide variety of needs .
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1 Hybrid Model: Dual Milling Configuration Available This ion milling system is equipped for both cross-section milling and flat milling. By switching the milling holder, it can be utilized for applications according to a wide range of purposes.
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The IM4000 Ar Ion Milling System offers two milling configurations available in a single instrument: cross section cutting and wide-area sample surface fine polishing. The new Ar ion gun design, with increased milling rate (300µm/h for Si), affords reduced cross section processing times by as much as 65%.
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1 Hybrid Model: Dual Milling Configuration Available This ion milling system is equipped for both cross-section milling and flat milling. By switching the milling holder, it can be utilized for applications according to a wide range of purposes.
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axis nature of the stage rotation from 0.0 – 5.0 mm. The specification in the IM4000 Instruction manual states that " An ion beam irradiation angle of 60° permits a uniform milling in a range 5-mm across with an approximately eccentricity of 4-mm." yet does not discuss the maximum milling area
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cleaving methods which often distort or induce damage. The IM4000 Ion Milling System utilizes a broad, low-energy Ar+ ion beam milling method to produce wider undistorted cross-sections without applying mechanical stress to the sample. High quality damage-less cross-section for the analysis of structures below the surface
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IM4000 Ion Milling System | High Technologies America, Inc. The IM4000 Ar ion milling system makes two milling configurations available . 's new IM4000 now allows to run both applications within the same machine. . Conventional mechanical polishing or cutting techniques on soft and . »More detailed
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Reproducible results. The Triple Ion Beam Milling System, Leica EM TIC 3X allows production of cross sections and planed surfaces for Scanning Electron Microscopy (SEM), Microstructure Analysis (EDS, WDS, Auger, EBSD) and, AFM investigations.
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Products by Industry. ... IM4000 Ion Milling System. SU5000 Schottky Field-Emission SEM with Revolutionary SEM Control. SU9000 UHR FE-SEM. Customized Gratings. EA6000VX High-Sensitivity XRF Analyzer. FT9500X Series High-Performance XRF Coating Thickness Gauge. AFM5000II Atomic Force Microscope Controller.
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** New 2012** Ion Milling System IM4000 with Zoom Stereomicroscope Viewing Assembly. Precision Cutting Tool. High precision flat sample polishing and cross-sectional cutting; 5mm wide cuts; cold finger attachment to increase cutting time while reducing thermal affects.
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The IM4000 is used for material processing and the resulting cross-section face observed by a variable pressure SEM. Figure one shows the IM4000 broad ion milling system capable of different modes such as cross -section milling, flatmilling©, low temperature milling and LN2 -cryo milling.
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The IM4000Plus Series Ion-Milling Systems are the second-generation of IM4000 series hybrid instruments that support Cross-Section Milling and Flatmilling®. A wide variety of system configurations are available: Standard, Cooling, Air Protection, and Cooling & Air Protection. Faster milling with improved ion optics (> 500 μm/h at 6 kV)
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The unique broad ion beam milling system of the Leica EM TIC 3X is the system of choice for EDS, WDS, Auger and EBSD, because ion beam milling is often found to be the only method capable of achieving high quality cross-sections and planed surfaces of almost any material. The process reveals the internal structures of a sample whilst minimizing deformation or damage.
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IM4000 Hybrid Ion Milling System. Capable of both cross-section and flat ion milling; Uses a wide Argon ion beam to irradiate specimens and uses the sputtering effect to polish the surface without stressing it; Features a high milling rate ion gun with a processing speed of 300 μm/hr
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Model IM4000 Milling System OBE 0038. ... In contrast, Sage Analytical Lab's ion beam sputtering is a stress-free physical process whereby atoms are ejected from a target material due to bombardment of the target by energetic particles.
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Oct 22, 2015 · Model IM4000Plus Ion Milling System supports effective Cross-section milling and Flat milling for better and faster specimen preparation.
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The latest generation of broad ion beam milling systems with improved milling speed. The IM4000Plus Ion Milling System utilizes a broad, low-energy Ar+ ion beam milling method to produce wider, undistorted cross-section milling or flat milling, without applying mechanical stress to the sample.
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The AJA Labview based Phase II-J computer control system is used on all ATC Orion Series Sputtering Systems . This straightforward, user friendly control system utilizes a large screen laptop in a 19" rack drawer connected to a single 4U rack mount hardware module.
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